Mode control in vertical-cavity surface-emitting lasers by post-processing using focused ion-beam etching
Dowd, P., Raddatz, L., Sumaila, Y., Asghari, M., White, I.H., Penty, R.V., Heard, P.J., Allen, G.C., Schneider, R.P., Tan, M.R.T., Wang, S.Y.Volume:
9
Year:
1997
Language:
english
DOI:
10.1109/68.618474
File:
PDF, 52 KB
english, 1997