Investigation of dynamic polarization stability of 850-nm GaAs-based vertical-cavity surface-emitting lasers grown on [311]B and [100] substrates
Uenohara, H., Tateno, K., Kagawa, T., Ohiso, Y., Tsuda, H., Kurokawa, T., Amano, C.Volume:
11
Year:
1999
Language:
english
DOI:
10.1109/68.752528
File:
PDF, 54 KB
english, 1999