Improving the accuracy of the wavelength-scanning technique...

IEEE Photonics Technology Letters 2000 Vol. 12; Iss. 2

Improving the accuracy of the wavelength-scanning technique for PMD measurements

Galtarossa, A., Palmieri, L., Schiano, M., Tambosso, T.
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Volume:
12
Year:
2000
Language:
english
DOI:
10.1109/68.823511
File:
PDF, 65 KB
english, 2000
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