High-reliability topological architectures for networks...

IEEE Journal on Selected Areas in Communications 2004 Vol. 22; Iss. 9

High-reliability topological architectures for networks under stress

Weichenberg, G., Chan, V.W.S., Medard, M.
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Volume:
22
Year:
2004
Language:
english
DOI:
10.1109/jsac.2004.835750
File:
PDF, 912 KB
english, 2004
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