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A Soft Error Rate Model for MOS Dynamic RAM's
Toyabe, T., Shinoda, T., Aoki, M., Kawamoto, H., Mitsusada, K., Masuhara, T., Asai, S.Volume:
17
Year:
1982
Language:
english
DOI:
10.1109/jssc.1982.1051742
File:
PDF, 937 KB
english, 1982