A Soft Error Rate Model for MOS Dynamic RAM's

Toyabe, T., Shinoda, T., Aoki, M., Kawamoto, H., Mitsusada, K., Masuhara, T., Asai, S.

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Volume:

Year:

1982

Language:

english

DOI:

10.1109/jssc.1982.1051742

File:

PDF, 937 KB

english, 1982

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