A Self-Testing Dynamic RAM Chip

IEEE Journal of Solid-State Circuits 1985 Vol. 20; Iss. 1

A Self-Testing Dynamic RAM Chip

Younggap You, Hayes, J.P.
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Volume:
20
Year:
1985
Language:
english
DOI:
10.1109/jssc.1985.1052325
File:
PDF, 1.36 MB
english, 1985
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