A 1-Mbit CMOS dynamic RAM with design-for test functions

IEEE Journal of Solid-State Circuits 1986 Vol. 21; Iss. 5

A 1-Mbit CMOS dynamic RAM with design-for test functions

McAdams, H., Neal, J.H., Holland, B., Inoue, S., Loh, W.K., Poteet, K.
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Volume:
21
Year:
1986
Language:
english
DOI:
10.1109/jssc.1986.1052588
File:
PDF, 1.00 MB
english, 1986
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