Modeling and experimental verification of substrate noise...

IEEE Journal of Solid-State Circuits 2003 Vol. 38; Iss. 7

Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies

Badaroglu, M., Donnay, S., De Man, H.J., Zinzius, Y.A., Gielen, G.G.E., Sansen, W., Fonden, T., Signell, S.
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Volume:
38
Year:
2003
Language:
english
DOI:
10.1109/jssc.2003.813254
File:
PDF, 805 KB
english, 2003
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