Threshold voltage mismatch and intra-die leakage current in...

IEEE Journal of Solid-State Circuits 2004 Vol. 39; Iss. 1

Threshold voltage mismatch and intra-die leakage current in digital CMOS circuits

Pineda de Gyvez, J., Tuinhout, H.P.
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Volume:
39
Year:
2004
Language:
english
DOI:
10.1109/jssc.2003.820873
File:
PDF, 649 KB
english, 2004
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