Performance degradation of LC-tank VCOs by impact of...

IEEE Journal of Solid-State Circuits 2005 Vol. 40; Iss. 7

Performance degradation of LC-tank VCOs by impact of digital switching noise in lightly doped substrates

Soens, C., Van der Plas, G., Wambacq, P., Donnay, S., Kuijk, M.
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Volume:
40
Year:
2005
Language:
english
DOI:
10.1109/jssc.2005.847301
File:
PDF, 1.02 MB
english, 2005
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