A Highly Scalable Interface Fuse for Advanced CMOS Logic...

IEEE Electron Device Letters 2012 Vol. 33; Iss. 2

A Highly Scalable Interface Fuse for Advanced CMOS Logic Technologies

Li-Yu Yang, Min-Che Hsieh, Jheng-Sin Liu, Yung-Wen Chin, Chrong Jung Lin
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Volume:
33
Year:
2012
Language:
english
DOI:
10.1109/led.2011.2175696
File:
PDF, 339 KB
english, 2012
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