The Effect of the Photo-Induced Carriers on the Reliability...

IEEE Electron Device Letters 2012 Vol. 33; Iss. 2

The Effect of the Photo-Induced Carriers on the Reliability of Oxide TFTs Under Various Intensities of Light

Soo-Yeon Lee, Sun-Jae Kim, Young Wook Lee, Woo-Geun Lee, Kap-Soo Yoon, Jang-Yeon Kwon, Min-Koo Han
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Volume:
33
Year:
2012
Language:
english
DOI:
10.1109/led.2011.2177633
File:
PDF, 308 KB
english, 2012
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