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Analysis of Threshold Voltage Variability Due to Random Dopant Fluctuations in Junctionless FETs
Gnudi, A., Reggiani, S., Gnani, E., Baccarani, G.Volume:
33
Year:
2012
Language:
english
DOI:
10.1109/led.2011.2181153
File:
PDF, 323 KB
english, 2012