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Differential Ideality Factor Technique for Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors
Minkyung Bae, Daeyoun Yun, Yongsik Kim, Dongsik Kong, Hyun Kwang Jeong, Woojoon Kim, Jaehyeong Kim, Inseok Hur, Dae Hwan Kim, Dong Myong KimVolume:
33
Year:
2012
Language:
english
DOI:
10.1109/led.2011.2182602
File:
PDF, 306 KB
english, 2012