Self-referencing dispersion characterization of multimode...

IEEE Photonics Technology Letters 2004 Vol. 16; Iss. 7

Self-referencing dispersion characterization of multimode structures using direct instantaneous frequency measurement

C. Dorrer, S. Ramachandran
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Volume:
16
Year:
2004
Language:
english
DOI:
10.1109/lpt.2004.828353
File:
PDF, 123 KB
english, 2004
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