Temperature Dependence of 980-nm Oxide-Confined VCSEL...

Temperature Dependence of 980-nm Oxide-Confined VCSEL Dynamics

Safaisini, R., Joseph, J.R., Louderback, D., Xiaojun Jin, Al-Omari, A.N., Lear, K.L.
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Volume:
20
Year:
2008
Language:
english
DOI:
10.1109/lpt.2008.926564
File:
PDF, 354 KB
english, 2008
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