Leaky Modes Analysis in Very Deeply Etched Semiconductor...

Leaky Modes Analysis in Very Deeply Etched Semiconductor Ridge Waveguides

Qiaoyin Lu, Wei-Hua Guo, Byrne, D., Donegan, J.F.
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Volume:
22
Year:
2010
Language:
english
DOI:
10.1109/lpt.2010.2040823
File:
PDF, 378 KB
english, 2010
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