IEEE Std 1500 Enables Modular SoC Testing

IEEE Design & Test of Computers 2009 Vol. 26; Iss. 1

IEEE Std 1500 Enables Modular SoC Testing

Marinissen, E.J., Zorian, Y.
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Volume:
26
Year:
2009
Language:
english
DOI:
10.1109/mdt.2009.12
File:
PDF, 563 KB
english, 2009
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