The Electrochemical Effects of Immersion Au on Electroless...

IEEE Transactions on Device and Materials Reliability 2012 Vol. 12; Iss. 2

The Electrochemical Effects of Immersion Au on Electroless Nickel and Its Consequences on the Hermetic Reliability of a Semiconductor Device

Herbsommer, J., Teutsch, T., Strandjord, A.
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Volume:
12
Year:
2012
Language:
english
DOI:
10.1109/tdmr.2011.2181948
File:
PDF, 633 KB
english, 2012
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