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An Interconnect Reliability-Driven Routing Technique for Electromigration Failure Avoidance
Chen, Xiaodao, Liao, Chen, Wei, Tongquan, Hu, ShiyanVolume:
9
Year:
2012
Language:
english
DOI:
10.1109/tdsc.2010.57
File:
PDF, 519 KB
english, 2012