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Signal standardization of the secondary ion mass spectrometry (SIMS) microscope for quantification of halogens and calcium in biological applications
J. JEUSSET, N. STELLY, C. BRIANÇON, S. HALPERN, M. ROSHANI, P. FRAGUVolume:
179
Year:
1995
Language:
english
DOI:
10.1111/j.1365-2818.1995.tb03647.x
File:
PDF, 1.32 MB
english, 1995