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Electronic transport across niobium-silicon interfaces
D.R. Heslinga, W.M. van Huffelen, T.M. Klapwijk, S.J.M. Bakker, E.W.J.M. van der DriftVolume:
30
Year:
1990
Language:
english
Pages:
5
DOI:
10.1016/0011-2275(90)90200-v
File:
PDF, 453 KB
english, 1990