Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2012 / 07 Vol. 6; Iss. 4
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Estimation of detection limits in electron probe X-ray microanalysis
Romanenko, I. M., Viryus, A. A., Churin, V. A., Deyanov, A. S., Ivanov, A. S.Volume:
6
Language:
english
Journal:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
DOI:
10.1134/s1027451012070105
Date:
July, 2012
File:
PDF, 187 KB
english, 2012