Investigation of the thermal degradation of the silicon field-emission cathode as a two-phase system
Dyuzhev, N. A., Makhiboroda, M. A., Kretov, V. I., Churilin, M. N., Rudnev, V. Yu.Volume:
41
Language:
english
Journal:
Russian Microelectronics
DOI:
10.1134/s1063739712070189
Date:
December, 2012
File:
PDF, 757 KB
english, 2012