Investigation of the thermal degradation of the silicon...

Investigation of the thermal degradation of the silicon field-emission cathode as a two-phase system

Dyuzhev, N. A., Makhiboroda, M. A., Kretov, V. I., Churilin, M. N., Rudnev, V. Yu.
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Volume:
41
Language:
english
Journal:
Russian Microelectronics
DOI:
10.1134/s1063739712070189
Date:
December, 2012
File:
PDF, 757 KB
english, 2012
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