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Microstructural characteristization of InGaN/GaN epitaxial Layers with Pt nanoclusters grown by using MOCVD on c-plane sapphire substrates
Zhixin Wan, Yinsheng He, Keesam Shin, Cheljong Choi, Eunkyung SuhVolume:
61
Language:
english
DOI:
10.3938/jkps.61.1283
Date:
October, 2012
File:
PDF, 426 KB
english, 2012