An Auger and electron energy‐loss study of reactions at the...

An Auger and electron energy‐loss study of reactions at the Ti‐SiO2 interface

Wallart, X., Zeng, H. S., Nys, J. P., Dalmai, G., Friedel, P.
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Volume:
69
Year:
1991
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.347472
File:
PDF, 1.34 MB
english, 1991
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