An Auger and electron energy‐loss study of reactions at the Ti‐SiO2 interface
Wallart, X., Zeng, H. S., Nys, J. P., Dalmai, G., Friedel, P.Volume:
69
Year:
1991
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.347472
File:
PDF, 1.34 MB
english, 1991