![](/img/cover-not-exists.png)
Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment
Rode, S., Stark, R., Lubbe, J., Troger, L., Schutte, J., Umeda, K., Kobayashi, K., Yamada, H., Kuhnle, A.Volume:
82
Year:
2011
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3606399
File:
PDF, 900 KB
english, 2011