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Evaluation of Cu:SC ratio measurements by chemical etching, electrical resistivity, and image analysis
Pyon, T., Warnes, W.H., Siddall, M.Volume:
3
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/77.233871
Date:
March, 1993
File:
PDF, 505 KB
english, 1993