Evaluation of Cu:SC ratio measurements by chemical etching,...

IEEE Transactions on Appiled Superconductivity 1993 / 3 Vol. 3; Iss. 1

Evaluation of Cu:SC ratio measurements by chemical etching, electrical resistivity, and image analysis

Pyon, T., Warnes, W.H., Siddall, M.
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Volume:
3
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/77.233871
Date:
March, 1993
File:
PDF, 505 KB
english, 1993
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