![](/img/cover-not-exists.png)
Migration of incorporated phosphorus in the anodic oxide film formation of tantalum
Fumihiro Arifuku, Hiroshi Yoneyama, Hideo TamuraVolume:
24
Year:
1979
Language:
english
Pages:
4
DOI:
10.1016/0013-4686(79)87100-5
File:
PDF, 337 KB
english, 1979