Dielectric behavior, band gap, in situ X-ray diffraction,...

Dielectric behavior, band gap, in situ X-ray diffraction, Raman and infrared study on (1 − x)BiVO4–x(Li0.5Bi0.5)MoO4 solid solution

Zhou, Di, Pang, Li-Xia, Qu, Wei-Guo, Randall, Clive A., Guo, Jing, Qi, Ze-Ming, Shao, Tao, Yao, Xi
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Volume:
3
Year:
2013
Language:
english
Journal:
RSC Advances
DOI:
10.1039/C3RA22604B
File:
PDF, 749 KB
english, 2013
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