Revealing trap depth distributions in persistent phosphors

Revealing trap depth distributions in persistent phosphors

Van den Eeckhout, Koen, Bos, Adrie J. J., Poelman, Dirk, Smet, Philippe F.
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Volume:
87
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.87.045126
Date:
January, 2013
File:
PDF, 1.89 MB
english, 2013
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