Including the Effect of a Future Test and Redesign in Reliability Calculations
Villanueva, Diane, Haftka, Raphael T., Sankar, Bhavani V.Volume:
49
Language:
english
Journal:
AIAA Journal
DOI:
10.2514/1.J051150
Date:
December, 2011
File:
PDF, 1.31 MB
english, 2011