Neutron-Induced Charge Collection Simulation of Bulk FinFET SRAMs Compared With Conventional Planar SRAMs
Fang, Yi-Pin, Oates, Anthony S.Volume:
11
Year:
2011
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2011.2168959
File:
PDF, 560 KB
english, 2011