Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains
Dodd, Paul E., Shaneyfelt, Marty R., Flores, Richard S., Schwank, James R., Hill, Thomas A., McMorrow, Dale, Vizkelethy, Gyorgy, Swanson, Scot E., Dalton, Scott M.Volume:
58
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2011.2169683
Date:
December, 2011
File:
PDF, 1.43 MB
english, 2011