Heavy Ion Characterization and Monte Carlo Simulation on 32...

IEEE Transactions on Nuclear Science 2011 / 12 Vol. 58; Iss. 6

Heavy Ion Characterization and Monte Carlo Simulation on 32 nm CMOS Bulk Technology

Uznanski, Slawosz, Gasiot, Gilles, Roche, Philippe, Autran, Jean-Luc, Dugoujon, Laurent
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Volume:
58
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2011.2170852
Date:
December, 2011
File:
PDF, 573 KB
english, 2011
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