SEU Prediction From SET Modeling Using Multi-Node...

IEEE Transactions on Nuclear Science 2011 / 06 Vol. 58; Iss. 3

SEU Prediction From SET Modeling Using Multi-Node Collection in Bulk Transistors and SRAMs Down to the 65 nm Technology Node

Artola, Laurent, Hubert, Guillaume, Warren, Kevin M., Gaillardin, Marc, Schrimpf, Ronald D., Reed, Robert A., Weller, Robert A., Ahlbin, Jonathan R., Paillet, Philippe, Raine, Melanie, Girard, Sylvain
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Volume:
58
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2011.2144622
Date:
June, 2011
File:
PDF, 1.00 MB
english, 2011
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