Parametric Variability Affecting 45 nm SOI SRAM Single...

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IEEE Transactions on Nuclear Science 2010 / 12

Parametric Variability Affecting 45 nm SOI SRAM Single Event Upset Cross-Sections

Loveless, Thomas Daniel, Alles, Michael L., Ball, Dennis R., Warren, Kevin M., Massengill, Lloyd W.
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Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2010.2081688
Date:
December, 2010
File:
PDF, 755 KB
english, 2010
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