In Flight SEU/MCU Sensitivity of Commercial Nanometric SRAMs: Operational Estimations
Artola, Laurent, Velazco, Raoul, Hubert, Guillaume, Duzellier, Sophie, Nuns, Thierry, Guerard, Bruno, Peronnard, Paul, Mansour, Wassim, Pancher, Fabrice, Bezerra, FrancoiseVolume:
58
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2011.2172220
Date:
December, 2011
File:
PDF, 1.22 MB
english, 2011