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Single Event Transient Hardness of a New Complementary (npn $+$ pnp) SiGe HBT Technology on Thick-Film SOI
Wilcox, Edward P., Phillips, Stanley D., Cheng, Peng, Thrivikraman, Tushar, Madan, Anuj, Cressler, John D., Vizkelethy, Gyorgy, Marshall, Paul W., Marshall, Cheryl, Babcock, Jeff A., Kruckmeyer, KirbyLanguage:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2010.2085014
Date:
December, 2010
File:
PDF, 797 KB
english, 2010