Fracture testing of silicon microelements in situ in a...

Fracture testing of silicon microelements in situ in a scanning electron microscope

Johansson, Stefan, Schweitz, Jan-Åke, Tenerz, Lars, Tirén, Jonas
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Volume:
63
Year:
1988
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.340471
File:
PDF, 826 KB
english, 1988
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