Optical characterization of double layers containing...

Journal of Modern Optics 2005 / 03 Vol. 52; Iss. 4

Optical characterization of double layers containing epitaxial ZnSe and ZnTe films

Šiler, Martin, Ohlídal, Ivan, Franta, Daniel, Montaigne Ramil, Alberto, Bonanni, Alberta, Stifter ¶, David, Sitter, Helmut
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Volume:
52
Language:
english
Journal:
Journal of Modern Optics
DOI:
10.1080/09500340410001731066
Date:
March, 2005
File:
PDF, 378 KB
english, 2005
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