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Converting a bulk radiation-hardened BiCMOS technology into a dielectrically-isolated process
DeLaus, M., Emily, D., Mappes, B., Pease, R.Volume:
40
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.273480
Date:
January, 1993
File:
PDF, 550 KB
english, 1993