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SEM Backscattered-Electron Images of Paint Cross Sections as Information Source for the Presence of the Lead White Pigment and Lead-Related Degradation and Migration Phenomena in Oil Paintings
Keune, Katrien, van Loon, Annelies, Boon, Jaap J.Volume:
17
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927610094444
Date:
September, 2011
File:
PDF, 585 KB
english, 2011