Free electrons and defects in microcrystalline silicon...

Free electrons and defects in microcrystalline silicon studied by electron spin resonance

Finger, F., Malten, C., Hapke, P., Carius, R., Flückiger, R., Wagner, H.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
70
Language:
english
Journal:
Philosophical Magazine Letters
DOI:
10.1080/09500839408240982
Date:
October, 1994
File:
PDF, 566 KB
english, 1994
Conversion to is in progress
Conversion to is failed