Free electrons and defects in microcrystalline silicon studied by electron spin resonance
Finger, F., Malten, C., Hapke, P., Carius, R., Flückiger, R., Wagner, H.Volume:
70
Language:
english
Journal:
Philosophical Magazine Letters
DOI:
10.1080/09500839408240982
Date:
October, 1994
File:
PDF, 566 KB
english, 1994