Wavelength-Scanned Surface-Enhanced Raman Excitation Spectroscopy
McFarland, Adam D., Young, Matthew A., Dieringer, Jon A., Van Duyne, Richard P.Volume:
109
Language:
english
Journal:
The Journal of Physical Chemistry B
DOI:
10.1021/jp050508u
Date:
June, 2005
File:
PDF, 387 KB
english, 2005