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Three-dimensional plastic response in polycrystalline copper via near-field high-energy X-ray diffraction microscopy
Li, S. F., Lind, J., Hefferan, C. M., Pokharel, R., Lienert, U., Rollett, A. D., Suter, R. M.Volume:
45
Language:
english
Journal:
Journal of Applied Crystallography
DOI:
10.1107/s0021889812039519
Date:
December, 2012
File:
PDF, 914 KB
english, 2012