Comparison of noise power spectrum methodologies in measurements by using megavoltage X-ray energies
Jung-Whan Min, Jin-Hyun Son, Hoi-Woun Jeong, Jung-Min Kim, Youl-Hun Seoung, Soon-Yong Son, Ho-Kyung Kim, Sang-Young Kim, Do-Wan Lee, Jae-Yong Jung, Tae-Suk Suh, Bo-Young ChoeVolume:
60
Language:
english
DOI:
10.3938/jkps.60.129
Date:
January, 2012
File:
PDF, 331 KB
english, 2012