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Structural characterization of a-plane Zn[sub 1âx]Cd[sub x]O (0â¤xâ¤0.085) thin films grown by metal-organic vapor phase epitaxy
ZuÌnÌiga-PeÌrez, J., MunÌoz-SanjoseÌ, V., Lorenz, M., Benndorf, G., Heitsch, S., Spemann, D., Grundmann, M.Volume:
99
Year:
2006
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2163014
File:
PDF, 854 KB
english, 2006