Oscillatory thickness dependences of the Seebeck coefficient in nanostructures based on compounds IV–VI
Freik, Dmytro M., Yurchyshyn, Igor K., Potyak, Volodymyr Yu., Lysiuk, Yuriy V.Volume:
27
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/jmr.2012.28
Date:
April, 2012
File:
PDF, 115 KB
english, 2012