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[NanoScience and Technology] Nanoscale Characterisation of Ferroelectric Materials || Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in PZT Thin Films
Alexe, Marin, Gruverman, AlexeiVolume:
10.1007/97
Year:
2004
Language:
english
DOI:
10.1007/978-3-662-08901-9_9
File:
PDF, 1.32 MB
english, 2004